New TEM

Date: Jan 14, 2013

SAS is continuing to expand its microscopy capability by the introduction of a new High Resolution JEOL JEM-2100 Transmission Electron Microscope (TEM) complete with Energy Dispersive X-ray Analysis (EDX).

Transmission Electron Microscopy is an essential tool in all fields of scientific research including semiconductor development, biology and materials science.

The new TEM enhances our present state of the art facilities at Salford Analytical Services.

We will be please to offer this new capability to our customers from December 2012.